On the third day of Technology Days, the spotlight was on Test & Inspection, featuring the latest innovations in test coverage software, boundary scanning, in-system programming, and advanced equipment designed to streamline and enhance electronic testing and inspection processes. This immersive day was dedicated to exploring top-tier equipment from leaders like Aster, XJTAG, SMH Technologies, Litepoint, and nVent SCHROFF, providing attendees a hands-on experience in state-of-the-art testing solutions.
Advanced Testing Equipment and Tools
Day 3 presented a comprehensive view of modern test and inspection equipment, each crafted to meet the highest industry standards for accuracy, functionality, and efficiency. Key equipment highlighted included:
- Aster Test Coverage Software: A robust solution for maximizing test coverage and defect analysis for PCB manufacturing, helping businesses optimize test strategies and enhance quality assurance processes.
- XJTAG Boundary Scan: Known for its efficient PCB boundary scan testing, XJTAG provides reliable ways to inspect and troubleshoot circuit board errors without physical probing, making it ideal for high-complexity boards.
- Litepoint Wireless Testing Solutions: Designed for signal analysis and wireless device testing, Litepoint’s tools ensure accurate signal strength, clarity, and compatibility, essential for devices in IoT, telecommunications, and beyond.
- SMH In-System Programming Solutions: A flexible solution for in-system programming, allowing for direct programming of devices within circuits and facilitating faster testing and deployment in production environments.
- nVent SCHROFF Racks & Enclosures: Customizable enclosures and racks tailored for electronic equipment, these solutions support efficient organization, durability, and protection for critical electronic testing components.
In-Depth Workshops and Interactive Sessions
The hands-on workshops gave attendees the chance to engage directly with this technology, gaining real-time insights and application tips from industry experts. The sessions were tailored to demonstrate how these testing and inspection solutions optimize processes, from boundary scans and test coverage analysis to wireless signal evaluation. Raul Ionel, R&D Collaborator, led a comprehensive presentation on functional test solutions, discussing how this equipment meets diverse industry needs.
We were honored to welcome international guests from our partner companies’ headquarters:
Aster – DFX & test coverage software
Jean-Michel Boivin / Director Int. sales
XJTAG – Boundary scan
Tommaso de Vivo / Vice president business development EMEA
Litepoint – Wireless test
Mathias Laursen /Product specialist
SMH – In-System programming
Ivan Liberotti / Software and firmware engineer
nVent/Schroff – Racks & enclosures
Filippo Cavalli /Vertical leader test and measurement
Functional Test Solutions
Raul Ionel /R&D Collaborator
A Celebration of Innovation and Community
In addition to the hands-on experience with top equipment, Technology Days Day 3 was a time to celebrate the community that has made these events a success. The day featured exciting raffle prizes, and our popular anniversary cake added a festive touch to the gathering.
Thank You to Our Clients and Partners
We are immensely grateful to everyone who joined us, from clients to dedicated partners who make our journey in test and inspection technology possible. Thank you for being a part of Technology Days and celebrating with us as we continue advancing in testing, inspection, and automation solutions.
Stay connected with us to stay ahead in the rapidly evolving world of test and inspection. With each Technology Days event, we look forward to sharing more advancements and innovative solutions to drive your success forward.
