We are excited to invite you to our 20th anniversary celebration, marking two decades of dedicated service and innovation for our valued customers. Join us for a three-day event, each day focusing on a different field of expertise:
Day One – Automation: Experience the latest in automation with cutting-edge demonstrations and presentations, including advancements in robotics such as: MiR Pallet Jack 1200, UR30 and Mobile Cobot.
Day Two – Test & Hardware & Software solutions: Discover innovations in performance ICT testing and quality assurance through X-Ray and AOI technologies, featuring state-of-the-art equipment like: Teradyne TSH ICT, Takaya APT-1600FD Flying Probe Tester, Mirtec MV6-OMNI AOI and Waygate Micromex X-Ray.
Day Three – Test & Inspection: Take a deep dive into cutting-edge tools and methodologies, exploring Aster’s test coverage software, XJTAG’s boundary scan for efficient PCB testing, Litepoint’s wireless testing solutions for comprehensive signal analysis, SMH’s in-system programming and nVent/Schroff racks & enclosures.
We are honored to welcome international guests from our partner companies’ headquarters. This event is a unique opportunity to engage with thought leaders and innovators shaping the future of their industries.
Don’t miss this chance to explore groundbreaking innovations and interact with industry experts. All automation and test & inspection equipment will be displayed throughout the entire 3-day event.
Day 1:September 17, Automation
| 08:30 – 9:30 | Welcome / Registration |
| 09:30 – 10:00 | Company presentation |
| 10:00 – 10:30 | MiR (Mobile Industrial Robots) Alberto Botarelli /Partner development director, EMEA Joerg Faber /Sales director North, Central & East Europe Teradyne Robotics |
| 10:30 – 10:45 | ROEQ (MiR accessories) Christoph Sander/ Head of sales |
| 10:45 – 11:00 | Nord Modules (MiR accessories) Mayuran Ponnampalam /Chief sales officer Kristian Kvistgaard /Chief technology officer |
| 11:00 – 11:30 | Coffee break |
| 11:30 – 12:00 | UR (Universal Robots) Razvan Isac /Sales development manager – CEE Region Daniel Niepsuj /Sales leader CEE |
| 12:00 – 12:30 | MiR Customer success stories |
| 12:30 – 12:45 | Integrator success stories |
| 12:45 – 13:15 | UR Customer success stories |
| 13:15 – 14:30 | Lunch |
| 14:30 – 16:45 | Automation demo sessions Demo X- Ray for non-electronic |
| 16:45 -17:00 | Raffle & closing day 1 |
Day 2:September 18, Test & Hardware & Software solutions
| 08:30 – 9:30 | Welcome /Registration |
| 09:30 – 10:00 | Company presentation |
| 10:00 – 10:30 | Mirtec AOI Wilson Kim /Managing director Europe |
| 10:30 – 11:00 | Waygate X-Ray André Egbert /Senior channel sales manager |
| 11:00 – 11:30 | Volume Graphics – CT software Vicentiu Tomescu /Sales manager |
| 11:30 – 12:00 | Coffee break |
| 12:00 – 12:30 | Teradyne In-Circuit Test Kurt Schankula /Sales manager Europe at Teradyne boardtest |
| 12.30 – 13.00 | Takaya – Flying Probe Miroslav Stanisavljević /Sales manager Systech Europe Kotaro Mizuno /Operations manager Itochu Europe |
| 13.00 – 14.00 | Lunch |
| 14.00 – 14.30 | ATX – Fixtures Dieter Ziegler /Technical consulting & sales |
| 14:30 – 16:45 | Demo test & inspection sessions |
| 16:45 – 17:00 | Raffle & closing day 2 |
Day 3: September 19, Test & Inspection
| 08:30 – 9:30 | Welcome / Registration |
| 09:30 – 10:00 | Company presentation |
| 10:00 – 10:30 | Aster – DFX & test coverage software Jean-Michel Boivin / Director Int. sales |
| 10:30 – 11:00 | XJTAG – Boundary scan Tommaso de Vivo / Vice president business development EMEA |
| 11.00 – 11:30 | Litepoint – Wireless test Mathias Laursen /Product specialist |
| 11:30 – 12:00 | Coffee break |
| 12:00 – 12:30 | SMH – In-System programming Ivan Liberotti / Software and firmware engineer |
| 12:30 – 13:00 | nVent/Schroff – Racks & enclosures Filippo Cavalli /Vertical leader test and measurement |
| 13:00 – 13:30 | Functional Test Solutions Raul Ionel /R&D Collaborator |
| 13:30 – 14:30 | Lunch |
| 14:30 – 15:30 | Demo test & inspection sessions |
| 15:30 – 15:45 | Raffle & closing day 2 |