Alfa Test is the regional partner for GOEPEL in Romania, Bulgaria, Serbia, Croatia, Slovenia, Bosnia and Herzegovina, Moldova and Ukraine. With GOEPEL electronic, we partner with over 30 years of expertise in embedded JTAG solutions and boundary scan technologies. This collaboration ensures access to world-class test solutions backed by Alfa Test’s strong technical know-how, fast local support, and commitment to quality and innovation—whether for complex PCB development, high-density assembly testing, or production scaling.
Goepel systems and technologies are developed and manufactured at the main site in Jena. The seal “Made in Germany” goes beyond national borders: With more than 240 employees, subsidiaries in the USA, China and India and a global service network, GÖPEL electronic is always close to its customers.
PicoTAP is an ultra-compact, USB-powered boundary scan controller ideal for entry-level, service, and field applications.
Key Technical Parameters:
• TAPs: 1 (single)
• Max Scan Frequency: 15 MHz
• I/O Voltage: Programmable 1.65–3.6 V
• Interface: USB 2.0
• Form Factor: USB stick design
• Compatibility: Fully integrated with CASCON software
SCANBOOSTER II is a compact USB boundary scan controller designed for R&D, validation, and production purposes.
Key Technical Parameters:
• TAPs: 2 independent, fully programmable
• Max Scan Frequency: 16 MHz
• I/O: 32-channel Multi-Purpose Programmable (MPP) I/O, 1.8–3.3 V (4 groups)
• Interface: USB 3.0
• Extension: Supports TIC/TEM adapters, fixture and FXT module integration
• Form Factor: Compact desktop unit, ideal for portable and flexible use
SCANFLEX II CUBE (A/B/C) is a modular, high-performance boundary scan controller for laboratory and production test environments.
Key Technical Parameters:
- TAPs: Up to 8 (fully programmable)
- Max Scan Frequency:
- CUBE A: 20 MHz
- CUBE B: 50 MHz
- CUBE C: 100 MHz
- Module Slots: 8 expansion slots for I/O modules
- Voltage Range: Programmable per TAP (1.2–3.6 V)
- Interfaces: USB 3.0, Gigabit Ethernet.
- Features: Scan Data Buffer (A), SPACE III architecture (B), FASTSCALE™ engine (C)
- Expansion: Compatible with full range of SCANFLEX II digital, analog, and high-speed modules
SCANFLEX II BLADE Series controllers deliver high-performance, scalable JTAG/boundary-scan solutions in a compact 19″ rack-mount design, ideal for industrial tests in both development and production environments.
Key Technical Parameters:
- Available as standalone units (BLADE 4), or in multi-controller rack configurations (BLADE 4 RMx1/2/3 and BLADE 8 RMx1/2)
- Supporting a wide range of debug and test protocols including JTAG, DAP, COP, SWD, BDM, SBW, and UART
- High-speed architecture upgradeable via FastScale™
- USB 3.0 and Gigabit Ethernet connectivity for fast integration and remote operation
Model Comparison:
| Model | TAPs | I/O Channels | I/O Voltage | Max TCK | Controller |
|---|---|---|---|---|---|
| BLADE 4 A/B/C | 4 | 64 | 0.9 – 3.6 V | 20/50/100 MHz | 1 |
| BLADE 4 RMx1/2/3 | 4/8/12 | 64/128/192 | 0.9 – 3.6 V | 20/50/100 MHz (A/B/C) | 1/2/3 |
| BLADE 8 RMx1/2 | 8/16 | 64/128 | 0.9 – 3.6 V | 20/50/100 MHz (A/B/C) | 1/2 |
SCANFLEX II PXIe C4 Series (FXT & LX) -Modular PXIe controllers for high-speed boundary scan and mixed-signal tests.
- SFX II PXIe C4/FXT: Up to 192 digital I/O, 4 TAPs (JTAG/ DAP/COP/SWD/UART/ BDM/SBW), differential or single-ended.
- SFX II PXIe C4/LX: Up to 128 digital I/O, 4 TAPs (JTAG/SPI), single-ended
- SPACE™, HYSCAN™, ADYCS™, ChipVORX®, FastScale™ tech included.
- Fast fixture integration for production & development.
Model Comparison:
| Model | Channels | Taps | Max TCK |
|---|---|---|---|
| SFX II PXIe C4/FXT A/B/C | 192 | 4 | 20/50/100 MHz |
| SFX II PXIe C4/LX A/B/C | 128 | 4 | 20/50/100 MHz |
Best choice for:
- FXT: Maximum channel count, all major debug protocols.
- LX: Cost-effective, high-performance, JTAG/SPI focus.
TIC (TAP Interface Card) modules connect SCANFLEX controllers to your DUT, offering programmable voltage and multi-protocol support (JTAG, SWD, SBW, BDM). TEM (TAP Extension Module) units extend and condition TAP signals for stable, high-speed operation –even in complex setups.
- TIC01/LX: 1 TAP, 0.9–3.6 V, JTAG/SWD/SBW/BDM.
- TIC01/VX: 1 TAP, 1.65–4.5 V, advanced protocols
- TIC120/LX: Multi-bus TAP, 0.9–3.6 V, broad protocol support
- TEM: TAP extension, buffering & conditioning
- TEM-ISO: TAP extension, galvanic isolation, up to 65 MHz
SFX Expansion modules add flexible, high-speed digital and analog I/O to SCANFLEX platforms for boundary scan, functional test, and embedded programming. All are fixture-ready for seamless integration
- SFX-6308: 8 electronic loads, dynamic rail loading, current measurement.
- SFX-9305: 16 digital I/O, BAC slots for CAN, LIN, USB, RS232, Ethernet, etc.
BAC Modules for SFX-9305:
Plug-and-play bus adapters for protocol-specific testing:
USB 2.0 Host/Slave, RS232, RS422/485, CAN (HS/LS), LIN, 10/100/1000 Ethernet
CION modules deliver high-density, programmable digital I/O for boundary scan and functional test – ideal for conventional assemblies and standard-speed applications.
CION-LX Modules
CION-LX Modules deliver all the benefits of CION Modules, but add enhanced signal integrity, higher-speed performance, and advanced timing features. They are specifically designed for demanding, high-speed digital test environments that require superior accuracy and reliability beyond the capabilities of standard CION Modules.
- CION-LX FXT32 / FXT48 / FXT96 / FXT192
High-speed, advanced timing, 32–192 channels
ChipVORX modules embed instrument IP in FPGAs/CPLDs for on-chip test, programming, and protocol emulation—no extra hardware required. Connect via TAP to access internal FPGA resources as digital test channels
Key Capabilities:
- High-speed flash programming, DDR SDRAM access
- Protocol emulation: PCIe, USB, SATA, Ethernet
- Built-in logic analyzer, pattern generator, BERT, frequency meter, ADC/DAC
- Easy, software-only configuration—no FPGA design required
Models:
ChipVORX Accessories
Expand connectivity and test options for ChipVORX modules:
- PCIe x1 Adapter: Direct PCI Express connection
- AdaptX PCIe x1 Adapter: For AdaptX X32 modules
- SATA Adapter: At-speed storage and protocol test
- Gbit LAN Adapter: Gigabit Ethernet/network testing
CASCON TS – Production Test Station is the production-ready runtime edition of the SYSTEM CASCON™ platform, designed for executing compiled boundary – scan test workflows.
Key Capabilities:
- Unpacks and runs compiled CASCON test projects
- Includes Pin Failure Diagnostic tools (PFD) and Universal Pin Failure Detection for detailed pin-level fault analysis (e.g., stuck‑at, opens, shorts)
- Offers Advanced Test Vector Browser to view and analyze test coverage and failures
- Includes the CASCON API for integration with any chosen test, automation, or manufacturing platform (e.g., LabVIEW, TestStand, Python, C#, custom software)
CASCON TS supports enhanced diagnostic functionality based on licensed edition::
| Features/Edition | Run Time | Failure Diagnostics | Diagnostics/ Repair |
|---|---|---|---|
| Execute compiled CASCON applications | ✔️ | ✔️ | ✔️ |
| Pin Failure Diagnostics | ✔️ | ✔️ | |
| CASCON Debugger and Pin Toggler | ✔️ |
CASCON DS – Development Station is a comprehensive development platform for boundary-scan and embedded tests, which enabling efficient project creation, advanced simulation, and in-depth debug features for any development workflow..
Key Highlights:
- Intuitive graphical project editor: Easily create and configure test projects for new designs or legacy PCBs
- Automatic test generation: Generate boundary-scan, interconnect, and ISP sequences directly from CAD, netlists, or BSDL files
- Real-time simulation & analysis: Simulate test execution, review fault coverage, and verify logic before hardware is available
- Integrated device library: Access a large library of device models for fast configuration and validation
- Step-by-step debugging: Trace and analyze failures at pin, net, or cluster level with interactive tools
- Fault visualization: Visualize test results and faults in schematic or layout view for rapid diagnosis and repair
- Batch processing and script automation: Streamline large projects or recurring tasks
- Flexible export: Seamlessly compile and transfer verified test projects for production execution with CASCON TS
- Comprehensive documentation tools: Generate test reports, diagnostic logs, and compliance summaries
- IP Technologies: ChipVORX, VarioTAP, JEDOS (depending on edition)
CASCON DS Edition Features:
| Features/Edition | Base | Standard | Professional | Expert |
|---|---|---|---|---|
| Infrastructure & interconnection IEEE 1149.1/6, ViPX, IEEE 1581 | ✔️ | ✔️ | ✔️ | ✔️ |
| Memory/Flash Access, Connection test, Test coverage analyzer | ✔️ | ✔️ | ✔️ | |
| Dynamic Memory Test, Logic Clusters, Basic VarioTAP, IEEE 1687, iJTAG, ScanVision | ✔️ | ✔️ | ||
| Automated logic components and truth table test, X-Bus Scripting | ✔️ |
Rent equipment
Renting test and automation equipment is an alternative most don’t consider when they have an immediate or short-term requirement for a certain test or automation application. Short term, immediate requirements for test equipment come up often; instances of equipment failure, project overload, unique testing and many other circumstances make renting test and automation equipment a desired service.