Alfa Test je regionalni partner za GOEPEL u Rumuniji, Bugarskoj, Srbiji, Hrvatskoj, Sloveniji, Bosni i Hercegovini, Moldaviji i Ukrajini. Sa GOEPEL electronic, sarađujemo sa preko 30 godina iskustva u Embedded JTAG rešenjima i Boundary Scan tehnologijama. Ova saradnja obezbeđuje pristup svetski priznatim test rešenjima potkrepljenim snažnim tehničkim znanjem Alfa Test-a, brzom lokalnom podrškom i posvećenošću kvalitetu i inovacijama – bilo da se radi o razvoju složenih štampanih ploča, testiranju sklopova visoke gustine ili skaliranju proizvodnje.
Goepel sistemi i tehnologije se razvijaju i proizvode u glavnoj lokaciji u Jeni u Nemačkoj. Oznaka „Made in Germany“ prevazilazi nacionalne granice. Sa više od 240 zaposlenih, podružnicama u SAD, Kini i Indiji i globalnom servisnom mrežom, GOEPEL Electronic je uvek blizu svojih kupaca.
PicoTAP is an ultra-compact, USB-powered boundary scan controller ideal for entry-level, service, and field applications.
Key Technical Parameters:
• TAPs: 1 (single)
• Max Scan Frequency: 15 MHz
• I/O Voltage: Programmable 1.65–3.6 V
• Interface: USB 2.0
• Form Factor: USB stick design
• Compatibility: Fully integrated with CASCON software
SCANBOOSTER II is a compact USB boundary scan controller designed for R&D, validation, and production purposes.
Key Technical Parameters:
• TAPs: 2 independent, fully programmable
• Max Scan Frequency: 16 MHz
• I/O: 32-channel Multi-Purpose Programmable (MPP) I/O, 1.8–3.3 V (4 groups)
• Interface: USB 3.0
• Extension: Supports TIC/TEM adapters, fixture and FXT module integration
• Form Factor: Compact desktop unit, ideal for portable and flexible use
SCANFLEX II CUBE (A/B/C) is a modular, high-performance boundary scan controller for laboratory and production test environments.
Key Technical Parameters:
- TAPs: Up to 8 (fully programmable)
- Max Scan Frequency:
- CUBE A: 20 MHz
- CUBE B: 50 MHz
- CUBE C: 100 MHz
- Module Slots: 8 expansion slots for I/O modules
- Voltage Range: Programmable per TAP (1.2–3.6 V)
- Interfaces: USB 3.0, Gigabit Ethernet.
- Features: Scan Data Buffer (A), SPACE III architecture (B), FASTSCALE™ engine (C)
- Expansion: Compatible with full range of SCANFLEX II digital, analog, and high-speed modules
SCANFLEX II BLADE (A/B/C, RMx/8RM) is a modular, rack-mount boundary scan controller optimized for automated production and inline test systems.
Key Technical Parameters:
- TAPs: Up to 8 (fully programmable; model dependent)
- Max Scan Frequency:
- BLADE 4 A: 20 MHz, up to 4 TAPs
- BLADE 4 B: 50 MHz, up to 4 TAPs
- BLADE 4 C: 100 MHz, up to 4 TAPs
- BLADE 4 RM, up to 4 TAPs / BLADE 8 RM: up to 8 TAPs, up to 100 MHz
- Module Slots: 4 or 8 (model dependent)
- Voltage Range: Programmable per TAP (0.9–3.6 V)
- Interfaces: USB 3.0, Gigabit Ethernet
- Expansion: Supports digital, analog, relay, and high-speed I/O modules
TIC (TAP Interface Card) modules connect SCANFLEX controllers to your DUT, offering programmable voltage and multi-protocol support (JTAG, SWD, SBW, BDM). TEM (TAP Extension Module) units extend and condition TAP signals for stable, high-speed operation –even in complex setups.
- TIC01/LX: 1 TAP, 0.9–3.6 V, JTAG/SWD/SBW/BDM.
- TIC01/VX: 1 TAP, 1.65–4.5 V, advanced protocols
- TIC120/LX: Multi-bus TAP, 0.9–3.6 V, broad protocol support
- TEM: TAP extension, buffering & conditioning
- TEM-ISO: TAP extension, galvanic isolation, up to 65 MHz
SFX Expansion Modules
SFX modules add flexible, high-speed digital and analog I/O to SCANFLEX platforms for boundary scan, functional test, and embedded programming. All are fixture-ready for seamless integration
- SFX-6308: 8 electronic loads, dynamic rail loading, current measurement.
- SFX-9305: 16 digital I/O, BAC slots for CAN, LIN, USB, RS232, Ethernet, etc.
BAC Modules for SFX-9305:
Plug-and-play bus adapters for protocol-specific testing:
USB 2.0 Host/Slave, RS232, RS422/485, CAN (HS/LS), LIN, 10/100/1000 Ethernet
CION modules deliver high-density, programmable digital I/O for boundary scan and functional test – ideal for conventional assemblies and standard-speed applications.
CION-LX Modules
CION-LX Modules deliver all the benefits of CION Modules, but add enhanced signal integrity, higher-speed performance, and advanced timing features. They are specifically designed for demanding, high-speed digital test environments that require superior accuracy and reliability beyond the capabilities of standard CION Modules.
- CION-LX FXT32 / FXT48 / FXT96 / FXT192
High-speed, advanced timing, 32–192 channels
ChipVORX modules embed instrument IP in FPGAs/CPLDs for on-chip test, programming, and protocol emulation—no extra hardware required. Connect via TAP to access internal FPGA resources as digital test channels
Key Capabilities:
- High-speed flash programming, DDR SDRAM access
- Protocol emulation: PCIe, USB, SATA, Ethernet
- Built-in logic analyzer, pattern generator, BERT, frequency meter, ADC/DAC
- Easy, software-only configuration—no FPGA design required
Models:
ChipVORX Accessories
Expand connectivity and test options for ChipVORX modules:
- PCIe x1 Adapter: Direct PCI Express connection
- AdaptX PCIe x1 Adapter: For AdaptX X32 modules
- SATA Adapter: At-speed storage and protocol test
- Gbit LAN Adapter: Gigabit Ethernet/network testing
All CASCON TS (Production Test Station) editions include:
CASCON API:
Standard API access for integration with production systems, automation, and data exchange.
Project Unpacking & Execution:
Ability to unpack CASCON project archives and execute compiled CASCON applications for streamlined test deployment on the production line.
Advanced Test Vector Browser:
Visualization and review of test vectors for detailed test coverage and failure analysis.
All development editions offer Diagnostics/Repair features. The differences between them are as follows:
The feature set is flexibly configurable according to specific customer requirements.
Contact us for guidance on GOEPEL’s CASCON system and help selecting the right edition for your application.
Iznajmite opremu
Iznajmljivanje opreme za testiranje i automatizaciju je alternativa koju većina ne razmatra kada postoje trenutne ili kratkoročne potrebe za određenim testom ili aplikacijom za automatizaciju. Često se javljaju kratkoročni, urgentni zahtevi za orpremu za testiranje; u slučajevima kad dođe do kvara opreme, urgentnog projekta, zahteva za specifičnim testiranjem ili drugih okolnosti, iznajmljivanje opreme za testiranje ili automatizaciju se nameće kao poželjna opcija.